AltiSurf© surface metrology instruments combine the metrological approach and optical microscopy in a 3D cartography, by taking successive profiles by scanning a chromatic confocal measurement point or a stylus with low support force.

Derived from the notion of roughness well known to mechanics, the in-depth knowledge of the valleys and peaks of the surface studied allows researchers and engineers to establish diagnoses of quality, functionality, aesthetics of their product or material with a new metrological approach.

This integrates new surface roughness parameters which are currently establishing the new measurement standard ISO 25 178 within ISO International through the work of the standardization committees. These systems also incorporate high-precision motorized plates to scan all types of samples.